BVM 729 - Kennlinienmessgerät
- Integration in automatische Anlagen über serielle Schnittstelle
- Ermittlung von Bauteileigenschaften in der Entwicklung, Produktion und Qualitätssicherung
- Sehr exakte und reproduzierbare Kennlinienermittlung durch digital gesteuerte Anstiegsrampen
Features
- Sperrspannung einstellbar im Bereich von 10 bis 3.000 V
- Sperrstrom einstellbar im Bereich von 50 µA bis 60 mA
- Sperrspannungsmessung wahlweise im DC- oder AC-Modus
- DC-Modus: Anstiegsgeschwindigkeit einstellbar von 0,1 bis 10 V/ms
- AC-Modus: Spannungserhöhung einstellbar von 5 bis 100 V/PULS
- Sperrstrommessung
Data Sheet
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Description
The measurement instrument BVM 729 is used to investigate the blocking characteristics of power semiconductors. Peak voltages of up to 3,000 V are available at currents of up to 60 mA.
The BVM 729 offers two operating modes:
- DC blocking voltage measurement: The test voltage will be increased until either the maximum output current or the maximum adjusted voltage is reached. The slew rate is adjustable in a range from 0,1 to 10 V/ms. As results the values of the max. reached voltage and the corresponding reverse current are indicated or transmitted.
- AC blocking voltage measurement (half wave mode): During the half wave mode the blocking voltage is applied as a 10 ms sinus half wave pulse with a repetition rate of 50 Hz. The peak voltage increases with each pulse by a specified value. The increase rate is adjustable in a range from 5 to 100 V per pulse.
The device can be operated through serial interface or manually using the operating elements on the front panel. The polarity of the specimen can be switched automatically, so the measurements can be done in forward and reverse direction without having to change the specimen itself.
The BVM 729 offers the possibility to indicate measuring results and diagrams on a monitor and to store them for later analysis or documentation.
Additionally, we offer a curve tracer application on PC, which allows the display of traces collected from the peak values of increasing test pulses.