This is what our quality assurance devices offer you
Innovative und zeitgemäße Messsysteme seit 1960
Overview
Today, product quality is the measure of all things and often the essential sales argument. We supply the tools for testing the service life expectancy of your modules - load cycles and high-temperature blocking bearings, parameterizable and remotely controllable, suitable also for your technology.
Produkte zur Qualitätssicherung
BVM 625
BLOCKING VOLTAGE MEASUREMENT UNIT
BVM 729
Characteristic Curve Measuring Device
BVM 738
BLOCKING VOLTAGE¬ TESTER FOR POWER SEMICONDUCTORS
DM 659
FORWARD VOLTAGE MEASURING DEVICE
DM 714
FORWARD VOLTAGE MEASURING DEVICE
DM 725
FORWARD VOLTAGE MEASURING DEVICE
DM 736
FORWARD VOLTAGE MEASUREMENT UNIT
DT 616
DIODE TESTER
FVM 625
FORWARD VOLTAGE MEASUREMENT UNIT
GSG 664
GATE STRESS GENERATOR
HTRB 689
TEST SYSTEM FOR HIGH TEMPERATURE REVERSE BIAS OF POWER SEMICONDUCTORS
HTRB 782
TEST STATION FOR HIGH TEMPERATURE REVERSE BIAS
HTRB 784
PRÜFANLAGE FÜR HOCHTEMPERATURSPERRLAGERUNG
IP 625
ISOLATION TESTER
IP 630
ISOLATION TESTER
KKM 740
CABLE CAPACITY MEASUREMENT DEVICE
KTM 604
CAPACITY TOLERANCE MEASURING BRIDGE FOR POWER CAPACITORS
LCM 625
MEASURING DEVICE FOR LEAKAGE CURRENT OF MOS-TRANSISTORS AND IGBTs
LRT 640
LOW RESISTANCE TESTER
MLH 634
MEASURING SYSTEM FOR POWER SEMICONDUCTORS
MU 746
MULTIPLEXER
SML 664
BLOCKING VOLTAGE¬ TESTER FOR POWER SEMICONDUCTORS
SML 726
BLOCKING VOLTAGE-TESTER FOR POWER SEMICONDUCTORS
STS 717
TEST SYSTEM FOR SEMICONDUCTORS
TLW 739
TEST SYSTEM FOR STABILITY OF SEMICONDUCTOR MODULES UNDER LOAD CHANGE
TLW 763
LOAD CYCLE TESTER FOR POWER SEMICONDUCTORS
TLW 800
TEST SYSTEM FOR STABILITY OF SEMICONDUCTOR MODULES UNDER LOAD CHANGE
TLW 813
LOAD CYCLE TESTER FOR POWER SEMICONDUCTORS
TLW 820
LOAD CYCLE TESTER FOR POWER SEMICONDUCTORS
TPS 625
TEST SYSTEM FOR POWER SEMICONDUCTORS
TSM 664
TEST SYSTEM FOR STATIC ELECTRICAL MEASUREMENTS OF POWER SEMICONDUCTORS
TSM 738
TEST SYSTEM FOR POWER SEMICONDUCTORS
WM 694
THERMAL RESISTANCE TESTER FOR POWER SEMICONDUCTORS
ZEH 634
MEASURING DEVICE FOR GATE- TRIGGER-, LATCHING AND HOLDING CURRENT
ZTH 749
THERMAL RESISTANCE TESTER FOR POWER SEMICONDUCTORS
Inquiry about Quality Assurance
Interested in products or updates in the field of Quality Assurance? Contact us — we're happy to advise you.