ZTH 749 - Wärmewiderstandsmessplatz
- Quick and repeatable measuring of R**TH** and Z**TH** in production and quality assurance
- Determination of RTH parts and ZTH time constants of the internal device structure
- Research applications into the behaviour of power semiconductors during development and design verification
Features
- Load current 3 x 10 – 400 A, usable as 3 single sources or
- 1 common channel
- Suitable for SCR, DIODE, IGBT and MOSFET – Devices, single and double types
- Recording of the cooling curves of up to 6 components, including Foster approximation, for the calculation of ZTH equivalent circuit diagrams
- Provides short time ZTH measurements (from 100 ms) up to long time RTH tests (9,999 seconds)
- With several reference temperature inputs
- Including Rack mounted industrial PC for system control, data storage and graphical analyses
- Control of external heating/ cooling unit
Description
The test system ZTH 749 is designed to measure the thermal resistance within power semiconductors devices.
The measurement of the temperature increase in a pn- junction is enabled by the relatively defined temperature behaviour of the forward voltage at small current densities.
This temperature coefficient is typically in a range of -2 mV/K and the variance is small for sample DUTs taken from the same production run.
By measuring the junction temperature curve after load pulse, the R**TH** and Z**TH **parts of the power package can be calculated.
The test system is controlled by an industrial PC running a Windows based user friendly software package that allows fast operator understanding.
Test configurations are programmed at the PC which provides real-time displays via monitor.
The pre-selected test parameters and subsequent test results are automatically saved to the PC for further review and analysis. The stored data can also be exported into an csv-file.