DT 616 - DIODE TESTER
- The measurement range is 1µA to to 4 mA.
- Manually testing of electrical devices in development, production and quality assurance
- Integration into an automated test system via serial interface and SPS-interface
- Automated DUT testing with rates of up to 20 DUTs per second
Features
- Forward voltage measurement
- Zener voltage measurement
- EZ-measurement
- Breakdown voltage measurement
- DV**BR**-measurement
- Reverse current measurement
- Kelvin contact measurement method
- Contact and polarity test of each measurement cycle
- Separate error counter for the different test steps
Data Sheet
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Description
The DT 616 tester is used for series measurement of diodes. It enables the testing of standard diodes, unipolar and bipolar Zener diodes:
**1.** **Forward voltage VF**
The voltage drop at the DUT is caused by a test current which is adjustable from 0.1 up to 20 A. It is measured at a resolution of 1 mV.
**2.** **Zener voltage VZ**
The test voltage is from 0 to 700 V. The measurement current ranges from 1 up to 500 mA.
**3.** **EZ-measurement**
For EZ measurement, the test current is being varied by ± 10%. The subsequent voltage change is measured.
**4.** **Breakdown voltage VBR**
The VBR-test voltage is adjustable in a range from 10 up to 2,500 V.
The tolerance range is set by a minimum and a maximum limit. The test voltage is limited to an adjusted maximum V**BR** +100 V.
**5.** **DVBR-measurement**
After the first V**BR**-measurement a second measurement cycle is started. During the first cycle an internal compensation voltage is measured, which is now used as reference. The DV**BR**-measurement can be implemented at a higher resolution.
**6.** **Reverse current** **IR**
Reverse current measurement is determined by applying a blocking voltage and monitoring the current value.