WM 694 - Wärmewiderstandsmessgerät
- Quick and reproducible measuring of R**TH** and Z**TH** in production and quality assurance
- Research into the behaviour of devices in development and application
Features
- Load current 1 A up to 100 A at a minimum of 15.0 V
- Measurement methods to MIL STD 750E for Diodes, NPN- Bipolar Transistors, N-MOS-FETs and IGBTs
- Suitable for short time ZTH measurements (from 2 ms) up to long time RTH tests (10 seconds and more on demand)
- Manual and remote operation via serial port
- PLC- Interface
Description
The measuring instrument WM 694 realises the measurement of the thermal resistance of power semiconductors.
The measurement of the temperature increase in a pn- junction is enabled by the relatively defined temperature behaviour of the forward voltage at small current density. This temperature coefficient is typically in a range of -2mV/K and the variance is small for samples taken from the same production run.
Measuring before and after a power pulse the temperature increase is measurable.
These results are used to calculate R**TH** or Z**TH**.
The test system is controlled by a microprocessor situated within the measurement unit. All test parameters, actual test methods and results are transmitted via serial interface to the operating PC.