TSM 664 - Testsystem für statische Messungen an Leistungshalbleitern
- Automatisierte Bauteilprüfung in der Produktion
- Überprüfung von statischen elektrischen Kenngrößen von Leistungshalbleitermodulen
Features
- Sperrspannungsmessung bis zu 8 kV
- Sperrstrommessung bis 300 mA
- Durchlassspannungsmessung bis zu 4.000 A, max. 500 µs
- VP-Messung
- gfs-Messung
- Gate-Leckstrommessung im Bereich von 1 nA bis 10 mA
- Gate-Ladungsmessung im Bereich von 0 bis 50 µC
- Messstellenumschalter mit 9 Kanälen
Description
The TSM 664 is used in the testing of power semiconductors and power semiconductor modules with up to 9 high power terminals.
The test system consists of up to 6 components and is fully variable dependant on test requirements.
The standard version includes:
- GSG 664 Gate-Stress-Device: test voltage up to 75 V, pulse duration adjustable in a range from 10 to 100 µs ± 1 µs.
- GM 664 Gate measuring device: test voltage up to 75 V, Gate leakage current measured from 1 nA to 10 mA.
- IO 625 Input-/Output extension
- SML 664 Blocking voltage tester: Blocking voltage measured up to 8 kV, reverse current measured up to 300 mA.
- MU 664 Multiplexer (9 ch) 9 x 4,000 A (main current path) 9 x 2 A (Sense terminals) 2 x 9 x 2 A (Gate terminals) 9 x 2 A (aux. Emitter terminals) Proof voltage: > 8,000 V. The MU 664 is used to connect the system components with the DUT terminals.
- DM 664 Forward voltage measuring device: current pulses up to 4,000 A, 500 µs, VP-measurement, gfs-measurement.
The test system is controlled via PC, connected by 2 serial interfaces. The user friendly software allows the simple creation of test routines as well as the classification of the DUT test results.