ZEH 634 - MEASURING DEVICE FOR GATE- TRIGGER-, LATCHING AND HOLDING CURRENT

ZEH 634 - MEASURING DEVICE FOR GATE- TRIGGER-, LATCHING AND HOLDING CURRENT

Features

  • Time-optimized measurement procedure for gate trigger-, latching- and holding current
  • Gate current source from 1 up to 3,000 mA
  • Anode current from 1 up to 5,000 mA
  • Open circuit voltage VAK 6V/12V
  • Measurement of gate voltage up to 5,000 V

Data Sheet

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Description

The instrument ZEH 634 is used for testing Thyristors.

The trigger characteristics of the gate, the latching current and the holding current in the anode circuit are measured:

**1.** **Gate Trigger test**

Two methods are available, to determine the lowest gate current:

a. Approximation method (similar to successive approximation): The gate trigger current is converged gradually towards the necessarily lowest gate trigger current. The duration of the gate pulse is 400 µs at a time, the pulses are repeated every millisecond.

b. Gate current ramp function: The gate current is increased at constant speed until the ignition takes place.

**2.** **Latching current test**

The standard procedure according to DIN IEC 747 intends a repetition of ignitions with a rising anode current until the latching current is reached. Similar to the ignition test, the ZEH 634 optimizes the measurement duration using an approximate procedure.

**3.** **Holding current test**

During the holding current test, the anode current is lowered continuously until the current breaks. The result depends in most cases on the rate of change of the anode current.

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Data Sheet PDF