STS 717 - TEST SYSTEM FOR SEMICONDUCTORS

Testing of power semiconductors and power semiconductor modules
All application areas of the individual devices
Reverse current measurement
Forward current measurement
Leakage current measurement
Gate stress generator

Features

Modular test system for testing static characteristics of power semiconductors in production and quality control applications
Extensive, freely configurable circuit matrix, built with 70 power and 70 sense channels
Support of the typical measurement methods for diodes, thyristors, IGBTs, MOS-FET and SIC-Mos
Modular generator concept for easy adaptation to special requirements
Standard measurement devices and generators up to 1,400 A at 40 V and 3,000 V at 20 mA
Clearly structured operating program for programming measurement starts and for production batches protocols
Including calibration module for easy traceability

Data Sheet

PDF Download

Product Inquiry

Application Areas

→ Laboratory → Production → Quality Assurance → Reverse voltage → Reverse current → Switching matrix → Gate leakage current, gate stress, gate charge → Forward voltage

Description

- Testing of power semiconductors and power semiconductor modules - All application areas of the individual devices - Reverse current measurement - Forward current measurement - Leakage current measurement - Gate stress generator

Interested in the STS 717 - TEST SYSTEM FOR SEMICONDUCTORS?

We're happy to advise you and provide a customized quote for your requirements.