LCM 625 - Leckstrommessgerät
- Measurement of Gate leakage current especially of power semiconductors with high Gate capacities
- Manually testing of MOS-transistors and IGBTs in development, production and quality assurance
- Integration in an automatical process via serial interface
Features
- Measuring ranges:
- 10 µA / 1 µA / 100 nA / 10 nA
- 20 nA / 200 nA / 2 µA / 20 µA
- 200 µA / 2 mA / 10 mA
- Adjustable measuring duration 100 ... 5 s
- Adjustable testing voltage -30 … +30 V
- Resolution 0.01 nA
- Manual and remote control via serial interface
Data Sheet
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Description
The measuring device for leakage currents LCM 625 is used for measuring the gate leakage currents of MOS-transistors and IGBTs during production (series measurement).
Due to accelerate the measurement the gate capacity (range **≤** 100 nF) is connected to GND by a low-impedance MOS-switch until the test voltage is reached. Then the leakage current is measured.
The leakage current is indicated on a display.
After the measurement has been finished the last measured value is displayed and transferred on request.
The testing voltage is adjustable within a range from 30.0 up to +30.0 V.
The measuring duration covers a range from 100 ms up to 5 s.
An additional display indicates both of the testing parameters.
The measurement can be started manually or via integrated serial interface.
Furthermore a data acquisition software is available for documentation of test lots and statistical evaluation.