DTS 761 - Dynamik Test System
- Test system for use in production and quality assurance
- For determination of the dynamic characteristics of power semiconductors during development
Features
- Static pre-test (reverse current and blocking voltage)
- Integrity test before and after each dynamic test
- Single and multiple pulse test of single and multiple modules on inductive load
- Check of short circuit characteristics
- 3-level-test to verify the dynamic characteristics
- Avalanche-test
- Gate voltage programmable
Data Sheet
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Description
The DTS 761 is used to determine the dynamic characteristics of power semiconductors during switching operation.
The DTS 761 is able to test single modules (1 DUT + 1 reverse diode), half bridges, 3-phase bridges and 3-phase bridges plus brake as well as 3-level modules.
The system consists of several parts:
1. Control Box CB 722: Includes sequencing and implementation of test cycles as well as HW-monitoring and power supply up to 2000 V.
2. Test Head TH 761: Components for dynamic and integrity test, current measuring probes, input of static pre-test. It also contains the changeable power capacitor, Inductance and Gatedrivers.
3. Oscilloscope: Provides measurement data of switching operations on the DUT.
4. Static pre-test unit BVM 625: Check of blocking voltage and reverse current.
5. Universal Test Adapter and Device Handler TA 761: The DUT is placed on a hating plate. For testing it is loaded into the specific adapter and automatic reloaded when tested pass.
6. Industrial-PC: Control and analysis of measurements, connected via serial and accordingly network interface.
The Test Software offers manual, and automatic test modes with automatic pass / fail decisions on test data or curve limit rules.