STS 805 - Static Test System

STS 805 - Static Test System

Features

  • Modular test system for testing static characteristics of power semiconductors in production and quality control applications
  • Extensive, freely configurable circuit matrix, built with 70 power and 70 sense channels
  • Support of the typical measurement methods for diodes, thyristors, IGBTs, MOS-FET and SIC-Mos
  • Modular generator concept for easy adaptation to special requirements
  • Standard measurement devices and generators up to 1,400 A at 40 V and 3,000 V at 20 mA
  • Clearly structured operating program for programming measurement starts and for production batches protocols
  • Including calibration module for easy traceability

Description

The STS measurement system is used to test power semiconductors and power semiconductor modules.

There are 70 freely usable power and sense connections abailable, which enable software-controlled connection of universal adapters.

Depending on the measurement requirements, measurements up to 1,400 A and 3,000 V can be carried out on power semiconductors. The measurement system is controlled via PC through a serial interface.

A user-friendly measurement program ensures easy operation, from the creation of measurement procedures to the result-related classification of measurement objects.

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Data Sheet PDF