TPS 746 - Test System for Power Semicondutor
- Testing of power semiconductors in development, production and quality assurance
- Classification of semiconductor packages
Features
- Modular test system for testing static characteristics of power semiconductors in production and quality control applications
- Extensive, freely configurable circuit matrix, built with 70 power and 70 sense channels
- Support of the typical measurement methods for diodes, thyristors, IGBTs, MOS-FET and SIC-Mos
- Modular generator concept for easy adaptation to special requirements
- Standard measurement devices and generators up to 1,400 A at 40 V and 3,000 V at 20 mA
- Clearly structured operating program for programming measurement starts and for production batches protocols
- Including calibration module for easy traceability
Data Sheet
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Description
The test system TPS 625 or 746 is used to test power semiconductors.
The TPS 625 enables the measurement of the common characteristics of power semiconductors with only one DUT contact assignment.
The system consists of maximum six components and can be varied depending on requirements. The standard equipment is intended to measure modules at up to 64 high current terminals and consists of the following components:
1. Trigger, ignition and holding current tester ZEH 634
2. Leakage current measurement unit LCM 625
3. Blocking voltage measurement unit BVM 625
4. Forward voltage measurement unit FVM 625
5. Multiplexer MU 625 / MU 746
The test system is controlled via serial interface. The comfortable measuring software allows the easy construction of measurement procedures and even the result-related classification of the DUTs.